Siemens introduces DFT solution
Summary
Engineered to address critical challenges like aging and environmental factors, which can lead to Silent Data Corruption or Errors (SDC/SDE), Tessent In-System Test is the industrys first in-system test controller designed specifically to work with Siemens’ Tessent Streaming Scan Network software. This compatibility allows customers to apply embedded deterministic test patterns in-system throughout a products lifecycle, which can help keep their ICs and the applications they power reliable, secure, and fully functional. “Tessent In-System Test is a major step forward in helping our customers achieve their Silicon Lifecycle Management goals,” said Ankur Gupta, Senior Vice President and General Manager, Digital Design Creation Platform, Siemens Digital Industries Software. It enables customers to reuse existing IJTAG- and SSN-based patterns for in-system applications while improving overall chip planning and reducing test time. Continuous monitoring of silicon devices throughout their lifecycle helps to ensure AWS customers benefit from infrastructure and services of the highest quality and reliability.”
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