Bruker Releases AFM Zoom Option for 3D Optical Microscopes

▤ Summary

Customers who are familiar with AFM technology will be amazed at how fast and easy it is to connect the NanoLens and begin collecting data,” added Rob Loiterman, Executive Vice President and General Manager of Bruker’s Stylus and Optical Metrology Business.Media Contacts: Stephen Hopkins, Marketing Communications Bruker Nano Surfaces Division 3400 East Britannia Drive, Suite 150, Tucson, AZ 85706 520-741-1044 x1022 steve.hopkins@bruker-nano.com http://www.bruker.com Barbara Stewart Patterson & Associates 480-488-6909 barbara@patterson.com Tucson, AZ, December 01, 2012 --( PR.com )-- Bruker announced at the 2012 Materials Research Society (MRS) Fall Meeting the release of the unique NanoLens™ Atomic Force Microscope (AFM) accessory for ContourGT® 3D optical microscopes.Designed for fast installation on a new five-position, fully automated turret, the compact NanoLens delivers unprecedented high-resolution imaging capabilities without sacrificing measurement speed in optical modes.Customers who are familiar with AFM technology will be amazed at how fast and easy it is to connect the NanoLens and begin collecting data,” added Rob Loiterman, Executive Vice President and General Manager of Bruker’s Stylus and Optical Metrology Business.From nanometer-scale roughness through millimeter-scale steps, with sub-nanometer z-axis resolution, the unmatched analysis capabilities, new color camera option, and NanoLens optional accessory establish the ContourGT systems as the new benchmark for flexibility and capability in surface measurement and imaging.About Bruker Corporation (NASDAQ: BRKR)Bruker Corporation is a leading provider of high-performance scientific instruments and solutions for molecular and materials research, as well as for industrial and applied analysis.

▦ Linked Companies

Bruker

$1B+