New Zebra OptoProfiler Tool for Patterned Solar CellBow, Warp, Full Surface Topography and Full Stress Tensor Characterization from Sunrise Optical LLC
Summary
Press Releases Sunrise Optical LLC Press Release Receive press releases from Sunrise Optical LLC: By Email RSS Feeds: New Zebra OptoProfiler Tool for Patterned Solar CellBow, Warp, Full Surface Topography and Full Stress Tensor Characterization from Sunrise Optical LLC A Solar Cell Metrology Tool Manufacturer has added a new 3rd generation Zebra OptoProfiler G3 to its product and services family.Sunrise, FL, April 15, 2008 --( Tool has capability to calculate variety of wafer topography parameters such as bow and warp.The Data collected by Zebra OptoProfiler can be exported in raw point cloud format for display and analysis using popular third party stress and design packages.### Sunrise, FL, April 15, 2008 --( PR.com )-- Zebra OptoProfiler is capable of measuring rough structured, painted, and diffuse reflective surfaces commonly encountered in solar cell manufacturing.Sunrise Optical LLC is serving the solar cell manufacturing, and thin film metrology markets.