Automatic Atomic Force Microscopy (AFM) with the FX40
Summary
Image Credit: Park Systems With an atomic force microscope (AFM), the user can reliably take repeated measurements of surface topography in three dimensions, with sub-nanometer resolution. The user then has to select a basic imaging mode, such as Tapping or Non-contact, tune the system, and manually guide the AFM tip to within detection range of the surface. Such complex procedures have stopped AFM from becoming mainstream, as it generally requires experienced technicians to acquire reproducible data of a high standard. Park Systems AFMs, like the NX- or XE-series, have already resolved some of the existing hurdles; a user-friendly interface that aids the operator select imaging parameters based on objective boundary conditions, and the addition of pre-mounted tips. The raw out-of-plane-motion (OPM) before image correction is <2 nm over 80 mm scan range, allowing precise measurements but without the effect of common leveling artifacts.