Testing solutions drive future of data transfers
Summary
The new transmitter automated test solutions are designed to meet the demanding requirements of next-generation technologies for large, rapid data transfers and low-latency video displays. The solutions also boast physical layer electrical testing and characterisation, which is crucial for designers to comply with the next-generation standards over the USB-C connector. “These solutions easily integrate into custom test environments and will enable our customers to test and debug USB4 designs that go into any device with a USB4 or TBT4 port –– from laptops to tablets and cell phones to televisions,” says Matt Ochs, general manager at Tektronix. “The results will be faster charging times and data transfers, plus a sleek new design that allows connection of up to six devices in parallel.” The new USB4 standard increases data transfer rates up to eight times faster than the USB 3.0 standard and delivers fast and secure 100W USB-C charging. • Compliant with the USB4 Specification Ver1.0 and USB4 Router Assembly Electrical Compliance Test Specification Rev 1.0 • Completes both Lane 0 and Lane 1 Transmitter tests without flipping the USB Type-C® connector or USB4 High-Speed fixture • Provides automatic DUT control support both TenLira/TDT (Intel’s scripts) and USB4 ETT • Offers a pre-compliance solution with Tektronix’s Proposed measurement for the Ultra High Bit Rate (UHBR) speeds • The TekExpress Pre-Recorded mode supports offline analysis and baseline for future specification changes Tektronix USB4, TBT4, and DP2.0 solutions are now available worldwide for use with DPO/MSO70000SX/DX oscilloscopes with 23 GHz bandwidth and above, and 100 GS/s sample rate.