BISTel Announces Collaboration with NXP Semiconductors to Supply Manufacturing AI Solutions for Continuous Improvement
Summary
Under this new multi-year, multi-fab collaboration, BISTel will deploy its award-winning manufacturing AI solutions, including Dynamic Fault Detection (DFD), chamber matching, eDatalzyer and the GrandView® predictive analytics in all front-end NXP fabs in the United States and Europe. This new agreement includes DFD fault detection, and eDatalyzer®, an innovative suite of machine learning based root cause analysis applications that quickly pinpoint and solve yield issues. “Our customers demand zero defect quality, and BISTel’s suite of applications enables our team to effectively and efficiently identify data signals from our equipment and our products, and move to more predictive verses reactive response,” commented Steve Frezon, Senior Vice President, Front End Operations at NXP. “We are focused on unlocking new insights that will lead to continuous improvement throughout our manufacturing ecosystem.” “We are delighted to be able to work with a proven leader like NXP,” noted Tom Ho, President, BISTel America. BISTel helps customers reduce downtime, improve yield, increase equipment utilization and achieve significant production and engineering efficiencies across the factory.