ZEISS ZEN Core Now Powers Smarter SEM Workflows Across All Platforms – Metrology and Quality News - Online Magazine
Summary
ZEISS has expanded ZEN core to support all ZEISS scanning electron microscopes, including focused ion beam SEMs. The software streamlines imaging, analysis, data management, and instrument control in one interface. It also adds AI-based workflows, automated TEM lamella preparation, and stronger correlative microscopy capabilities across ZEISS microscope families. The release targets both experts and non-experts in research and industrial labs, improving throughput, repeatability, and multi-modal experiment workflows.
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