EECL launches off-the-shelf source measurement unit
Summary
This release marks the completion of EECL’s RF and microwave out of the box test equipment portfolio, targeting applications where fast pulse measurements, power cycling, and accurate current profiling are critical performance factors. “Now that IoT is coming to fruition, theres growing demand for off-the-shelf precision measurement tools capable of wafer-level validation at an affordable price point,” explains Ben Kieniewicz, CEO of EECL. The SMU-04103 makes this level of performance readily available to a range of industries with a flexible, affordable, turnkey solution.” The SMU-04103 consolidates the functionality of multiple power supplies and science grade multimeters into a single, compact 4 channel system, dramatically simplifying setup whilst delivering superior performance compared to conventional systems. Multiple units can be stacked, offering synchronized operation with hundreds of channels, while trigger in/out connections allow for precise timing control, imperative for rapid pass/fail testing environments. • High Precision Current Measurement: From 5A down to 1pA, enabling >100 GΩ resistance measurements • Ultra-Fast Sampling: 1 million samples per second for accurate pulse capture and waveform reconstruction • Flexible Pulse Control: Pulse durations from 1µs to unlimited with adjustable slopes to minimize inductive effects • Integrated Control Interface: Centralised user interface with significantly reduced noise compared to conventional systems capable of full SCPI control.