HIL test suite cuts time to market and costs
Summary
The suite enables engineers to reuse modular components and leverage NI’s Switch Load and Signal Conditioning hardware for edge case detection across test systems. Embodying Emerson’s open, software-defined, intelligent test approach using modular hardware, NI LabVIEW+ Suite for HIL enables customers to adapt quickly to new challenges. As product designers shift functionality away from electromechanical systems toward embedded software, there is a greater requirement for rigorous testing through a continuous integration process. The new suite adds value to Emerson’s existing HIL user base and new adopters of the platform by streamlining their workflows and future-proofing their designs against the evolving complexity of next generation products. And it adds two software products with new native integration capabilities launched in 2025 - NI TestStand, which enables automation of complex test systems to meet the rising demand for efficient and scalable testing solutions, and NI DIAdem, whichallows advanced post-process data review and analysis, ensuring engineers can make informed decisions quickly.