Toshiba releases high-speed photorelay for semiconductor testers
Summary
Particularly suitable for the pin electronics of semiconductor testers, the TLP3450S makes measuring devices-under-test (DUTs) at fast speeds more precise. The new TLP3450S is based upon an upgraded internal configuration with enhanced infrared LEDs coupled to photodiode arrays that have an optimised design. Compared to the previous generation (TLP3450), this represents a 40% improvement, which will significantly benefit the overall throughput of the ATE system. The device also has a lower on-resistance (RON – typically 6.8Ω) that improves signal attenuation when the output is in ON state. To achieve this, the TLP3450S is housed in a tiny S-VSON4T package measuring just 1.45mm × 2.0mm × 1.3mm – an 18% reduction in footprint when compared to conventional products.