Pentamaster Introduces Trooper-BI Series – Single/Multi Chuck Wafer-Level Burn-in Solutions for Silicon Carbide (SiC) – pentamaster
Summary
Penang, Malaysia (July 2024) – Pentamaster, a leading global provider of semiconductor test and burn-in solutions, is thrilled to announce the launch of our Trooper-BI series. This series supports configurations ranging from single to multiple thermal chucks and is specifically designed for silicon carbide (SiC) applications. The Trooper-BI series offers a comprehensive, fully automated solution for wafer-level silicon carbide burn-in, accommodating a range of customizations and designs to support mass production testing. The system supports 6” to 8” wafers and multiple probe tests, with thermal chuck temperatures reaching up to 200°C. We are delighted to introduce our latest models: the Trooper-BI6 and Trooper-BI8-G, which facilitate the parallel burn-in of 6 to 8 wafers, delivering high throughput.