Pentamaster unveils its 2nd generation WLBI-22 which paves the way for cost effective and advance burn-in test solution for SiC wafer. – Pentamaster
Summary
Pentamaster unveils its 2nd generation WLBI-22 which paves the way for cost effective and advance burn-in test solution for SiC wafer. Penang, Malaysia (May 2022) – As a global one-stop solutions provider for standard and customized test equipment, Pentamaster is proud to announce the release of our second-generation wafer burn-in tester – WLBI-22 that paves the way for the future of electric vehicles, ensuring that every single silicon carbide (SiC) that enters EVs are automotive-qualified before real world usage. At Pentamaster, we don’t stay complacent and are constantly developing our solutions alongside the trends & technologies around us to accommodate new test criteria and requirements from our customers. Failures in the end markets of electric vehicles, chargers, and energy infrastructure would be catastrophic for both manufacturers and consumers. Due to qualification requirements to operate at very extreme temperatures for long periods of time, there’s no skimping out on testing.