WLBI-22 Wafer-Level Power Device Burn-in Test Handler – Pentamaster
Summary
It is the latest wafer-level burn-in test system designed for power devices. This innovative tester accommodates 2 wafer test parallelism, 720 die test parallelism per wafer. Independent driver channels for simultaneous voltage/current measurement as well as temperature monitoring. Designed with a seal chamber to accommodate inert gas such as nitrogen and arc suppression gasses, it protects the DUTs from arc & oxidation while keeping the tester in an operational temperature state without overheating. • All in one solution with built-in test chambers
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