AI-powered software aids chip yields

▤ Summary

Device yields are key performance indicators in semiconductor production, requiring continuous engineering efforts to debug and fine-tune. The unique ACS EASY application uses AI to automatically monitor test conditions and inferences to isolate and analyse the causes of yield degradation. The solution’s GUI facilitates the online sharing of test results, eliminating the need to create separate reports. A leading Advantest customer evaluated ACS EASY’s ability to automatically analyse data from its test floor, a task that used to consume 100 engineering hours per day. “It has long been anticipated that the use of AI and advanced data analytics would allow IC testing to make great strides forward.

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