Advantest Introduces Three New Instrument Modules and an Enhanced Performance (EP) Package for the T2000 SOC Test Platform
Summary
Santa Clara, CA, December 02, 2010 --( New products to offer greater ATE platform efficiencies, providing reduced test costs, and improved time-to-market and time-to-yield Advantest Corporation (TSE: 6857, NYSE: ATE) announced it will take advantage of the opportunity provided by Semicon Japan to preview three new modules and an infrastructure enhancement, named Enhanced Performance (EP) Package, for the T2000 SOC test platform.The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has recently introduced critical dimension scanning electron microscopes essential to photomask manufacturing, as well as a groundbreaking 3D imaging and analysis tool.### Santa Clara, CA, December 02, 2010 --( PR.com )-- Advantest Introduces Three New Instrument Modules and an Enhanced Performance (EP) Package for the T2000 SOC Test PlatformNew products to offer greater ATE platform efficiencies, providing reduced test costs, and improved time-to-market and time-to-yieldAdvantest Corporation (TSE: 6857, NYSE: ATE) announced it will take advantage of the opportunity provided by Semicon Japan to preview three new modules and an infrastructure enhancement, named Enhanced Performance (EP) Package, for the T2000 SOC test platform.Customers are invited to preview these new technologies at SEMICON Japan 2010, December 1-3, at Chibas Makuhari Messe.While sales of PCs, cellular phones, and other electronics are soaring across the developing world, semiconductor ASPs are in decline.The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has recently introduced critical dimension scanning electron microscopes essential to photomask manufacturing, as well as a groundbreaking 3D imaging and analysis tool.